Thursday, October 24, 2013, 12:30 PM
Room 125, Materials Science Building, UVA
Advanced nanoscale materials such as nanoparticles, thin films, and composite fibers are the subject of a highly active research. Consequently, it is important to develop the techniques of a careful characterization of these systems by fast and reliable methods. The small angle X-ray scattering (SAXS) technique offers precise and fast measurements to investigate parameters such as the size, shape, and interaction effects of particles in solution. Also the measurements on solids, for example thin films with mesoscopic structures, are commonly carried out applying small-angle X-ray scattering. In many ways, SAXS can be considered a complementary method to TEM, AFM, or NMR techniques. SAXS measurements are performed at synchrotron facilities or, thanks to recent developments, using laboratory instruments, which have become an excellent alternative.
Using current application examples, we are going to present the latest developments in SAXS techniques using the Anton Paar laboratory SAXS instruments. Thanks to the high-flux X-ray sources, short exposure times are possible. Additionally, Anton Paar researchers have explored novel techniques in sample positioning, which are commonly known from synchrotron measuring stations to allow the extension of the available detection range and to resolve the smallest dimensions.